SPIE Proceedings [SPIE SPIE OPTO - San Francisco, California, USA (Saturday 2 February 2013)] Terahertz, RF, Millimeter, and Submillimeter-Wave Technology and Applications VI - 3D terahertz beam profiling

✍ Scribed by Klarskov, Pernille; Sadwick, Laurence P.; O'Sullivan, Créidhe M.; Strikwerda, Andrew C.; Wang, Tianwu; Zalkovskij, Maksim; Jepsen, Peter U.

• Book ID: 121389639
• Publisher: SPIE
• Year: 2013
• Weight: 577 KB
• Volume: 8624
• Category: Article
• DOI: 10.1117/12.2002009