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SPIE Proceedings [SPIE SPIE OPTO - San Francisco, California, USA (Saturday 2 February 2013)] Novel In-Plane Semiconductor Lasers XII - Comparison of catastrophic optical damage in InP/(Al)GaInP quantum dot and quantum well diode lasers

✍ Scribed by Elliott, Stella N.; Hempel, Martin; Shutts, Sam; Zeimer, Ute; Smowton, Peter M.; Tomm, Jens W.; Belyanin, Alexey A.; Smowton, Peter M.

Book ID: 121372378
Publisher: SPIE
Year: 2013
Weight: 641 KB
Volume: 8640
Category: Article
DOI: 10.1117/12.2008319

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