SPIE Proceedings [SPIE SPIE OPTO - San Francisco, California (Saturday 22 January 2011)] Ultrafast Phenomena in Semiconductors and Nanostructure Materials XV - 355 nm and 1064 nm-pulse mixing to identify the laser-induced damage mechanisms in KDP

✍ Scribed by Reyné, Stéphane; Tsen, Kong-Thon; Song, Jin-Joo; Duchateau, Guillaume; Natoli, Jean-Yves; Betz, Markus; Elezzabi, Abdulhakem Y.; Lamaignère, Laurent

• Book ID: 120829160
• Publisher: SPIE
• Year: 2011
• Weight: 420 KB
• Volume: 7937
• Category: Article
• DOI: 10.1117/12.872855