SPIE Proceedings [SPIE SPIE OPTO - San Francisco, California (Saturday 22 January 2011)] Oxide-based Materials and Devices II - Radiation damage formation and annealing in GaN and ZnO

✍ Scribed by Lorenz, K.; Peres, M.; Franco, N.; Marques, J. G.; Miranda, S. M. C.; Magalhães, S.; Monteiro, T.; Wesch, W.; Alves, E.; Wendler, E.; Teherani, Ferechteh H.; Look, David C.; Rogers, David J.

• Book ID: 120321407
• Publisher: SPIE
• Year: 2011
• Weight: 651 KB
• Volume: 7940
• Category: Article
• DOI: 10.1117/12.879402