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SPIE Proceedings [SPIE SPIE OPTO: Integrated Optoelectronic Devices - San Jose, CA (Saturday 24 January 2009)] Novel In-Plane Semiconductor Lasers VIII - New approaches towards the understanding of the catastrophic optical damage process in in-plane diode lasers

โœ Scribed by Tomm, Jens W.; Ziegler, Mathias; Talalaev, Vadim; Matthiesen, Clemens; Elsaesser, Thomas; Bou Sanayeh, Marwan; Brick, Peter; Reufer, Martin; Belyanin, Alexey A.; Smowton, Peter M.


Book ID
121712925
Publisher
SPIE
Year
2009
Weight
689 KB
Volume
7230
Category
Article

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