SPIE Proceedings [SPIE SPIE Optical Systems Design - Barcelona, Spain (Monday 26 November 2012)] Optical Systems Design 2012 - Skew aberration analysis

✍ Scribed by Young, Garam; Chipman, Russell A.; Mazuray, Laurent; Wartmann, Rolf; Wood, Andrew P.; de la Fuente, Marta C.; Tissot, Jean-Luc M.; Raynor, Jeffrey M.; Kidger, Tina E.; David, Stuart; Benítez, Pablo; Smith, Daniel G.; Wyrowski, Frank; Erdmann, Andreas

• Book ID: 118155309
• Publisher: SPIE
• Year: 2012
• Weight: 583 KB
• Volume: 8550
• Category: Article
• DOI: 10.1117/12.981324