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SPIE Proceedings [SPIE SPIE Optical Metrology 2013 - Munich, Germany (Monday 13 May 2013)] Optical Measurement Systems for Industrial Inspection VIII - Development of program package for investigation and modeling of carbon nanostructures in diamond like carbon films with the help of Raman scattering and infrared absorption spectra line resolving
✍ Scribed by Hayrapetyan, David B.; Lehmann, Peter H.; Osten, Wolfgang; Hovhannisyan, Levon; Mantashyan, Paytsar A.; Albertazzi, Armando
- Book ID
- 121380960
- Publisher
- SPIE
- Year
- 2013
- Weight
- 248 KB
- Volume
- 8788
- Category
- Article
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