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SPIE Proceedings [SPIE SPIE Optical Metrology 2013 - Munich, Germany (Monday 13 May 2013)] Optical Methods for Inspection, Characterization, and Imaging of Biomaterials - Scanning ion conductance microscopy (SICM): from measuring cell mechanical properties to guiding neuron growth

✍ Scribed by Pellegrino, Mario; Orsini, Paolo; Pellegrini, Monica; Tognoni, Elisabetta; Ascoli, Cesare; Baschieri, Paolo; Dinelli, Franco; Ferraro, Pietro; Ritsch-Marte, Monika; Grilli, Simonetta; Stifter, David

Book ID: 120822125
Publisher: SPIE
Year: 2013
Weight: 356 KB
Volume: 8792
Category: Article
DOI: 10.1117/12.2021541

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