SPIE Proceedings [SPIE SPIE Optical Engineering + Applications - San Diego, California, United States (Sunday 25 August 2013)] Remote Sensing and Modeling of Ecosystems for Sustainability X - Monitoring urbanization in Shanghai from 1990 to 2005

✍ Scribed by You, Chong; Shi, Runhe; Gao, Wei; Jackson, Thomas J.; Wang, Jinnian; Chang, Ni-Bin

• Book ID: 121376266
• Publisher: SPIE
• Year: 2013
• Weight: 771 KB
• Volume: 8869
• Category: Article
• DOI: 10.1117/12.2022149