SPIE Proceedings [SPIE SPIE Optical Engineering + Applications - San Diego, California, United States (Sunday 25 August 2013)] Infrared Sensors, Devices, and Applications III - Radiation hardness by design for mixed signal infrared readout circuit applications

✍ Scribed by Gaalema, Stephen; Gates, James; Dobyns, David; Pauls, Greg; Wall, Bruce; LeVan, Paul D.; Sood, Ashok K.; Wijewarnasuriya, Priyalal S.; D'Souza, Arvind I.

• Book ID: 121373034
• Publisher: SPIE
• Year: 2013
• Weight: 859 KB
• Volume: 8868
• Category: Article
• DOI: 10.1117/12.2024671