✦ LIBER ✦

SPIE Proceedings [SPIE SPIE Optical Engineering + Applications - San Diego, California, USA (Sunday 21 August 2011)] Dimensional Optical Metrology and Inspection for Practical Applications - Remote ultrasensitive laser microphone

✍ Scribed by Sánchez Guerrero, G.; Guajardo Gonzáles, C.; Viera González, P.; Selvas, R.; Ramos Traslosheros, L.

No coin nor oath required. For personal study only.

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