SPIE Proceedings [SPIE SPIE Optical Engineering + Applications - San Diego, California, United States (Sunday 25 August 2013)] Hard X-Ray, Gamma-Ray, and Neutron Detector Physics XV - Raman analysis of Zn 1-x Mn x Te polycrystalline films

✍ Scribed by Klimov, O. V.; Kurbatov, D. I.; Opanasyuk, A. S.; Kosyak, V. V.; Kopach, V.; Fochuk, P. M.; Bolotnikov, A. E.; James, R. B.; Fiederle, Michael; Burger, Arnold; Franks, Larry; James, Ralph B.

• Book ID: 121302565
• Publisher: SPIE
• Year: 2013
• Weight: 543 KB
• Category: Article
• DOI: 10.1117/12.2023280