SPIE Proceedings [SPIE SPIE Optical Engineering + Applications - San Diego, California, USA (Sunday 12 August 2012)] X-Ray Free-Electron Lasers: Beam Diagnostics, Beamline Instrumentation, and Applications - Pump-probe laser development for the European X-ray Free-Electron Laser facility

✍ Scribed by Lederer, Max J.; Pergament, Mikhail; Kellert, Martin; Mendez, Cruz; Moeller, Stefan P.; Yabashi, Makina; Hau-Riege, Stefan P.

• Book ID: 120249711
• Publisher: SPIE
• Year: 2012
• Weight: 481 KB
• Volume: 8504
• Category: Article
• DOI: 10.1117/12.928961