SPIE Proceedings [SPIE SPIE Optical Engineering + Applications - San Diego, California, USA (Sunday 12 August 2012)] Applications of Digital Image Processing XXXV - Study of decoder complexity for HEVC and AVC standards based on tool-by-tool comparison

✍ Scribed by Ahn, Y. J.; Han, W. J.; Sim, D. G.; Tescher, Andrew G.

• Book ID: 120084715
• Publisher: SPIE
• Year: 2012
• Weight: 522 KB
• Volume: 8499
• Category: Article
• DOI: 10.1117/12.954123