SPIE Proceedings [SPIE SPIE NanoScience + Engineering - San Diego, California, USA (Sunday 12 August 2012)] Nanoengineering: Fabrication, Properties, Optics, and Devices IX - Scanning Raman spectroscopy of few- and single-layer MoS 2 flakes

✍ Scribed by Plechinger, G.; Heydrich, S.; Hirmer, M.; Schrettenbrunner, F.-X.; Weiss, D.; Eroms, J.; Schüller, C.; Korn, T.; Dobisz, Elizabeth A.; Eldada, Louay A.

• Book ID: 120069897
• Publisher: SPIE
• Year: 2012
• Weight: 642 KB
• Category: Article
• DOI: 10.1117/12.928068