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SPIE Proceedings [SPIE SPIE Microtechnologies - Grenoble, France (Wednesday 24 April 2013)] Smart Sensors, Actuators, and MEMS VI - Investigation on the dielectric behavior of aluminum nitride thin films at different temperatures applying a time-zero approach

✍ Scribed by Schneider, Michael; Bittner, Achim; Schmid, Ulrich; Schmid, Ulrich; Sánchez de Rojas Aldavero, José Luis; Leester-Schaedel, Monika


Book ID
121423885
Publisher
SPIE
Year
2013
Weight
656 KB
Volume
8763
Category
Article

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