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SPIE Proceedings [SPIE SPIE Laser Damage - Boulder, Colorado, USA (Sunday 23 September 2012)] Laser-Induced Damage in Optical Materials: 2012 - An exhaustive study of laser damage in ion beam sputtered pure and mixture oxide thin films at 1030 nm with 500 fs pulse durations

✍ Scribed by Gallais, Laurent; Mangote, Benoit; Commandré, Mireille; Mende, Mathias; Jensen, Lars; Ehlers, Henrik; Jupé, Marco; Ristau, Detlev; Melninkaitis, Andrius; Sirutkaitis, Valdas; Kičas, Simonas; Tolenis, Tomas; Drazdys, Ramutis; Exarhos, Gregory J.; Gruzdev, Vitaly E.; Menapace, Joseph A.; Ristau, Detlev; Soileau, M J

Book ID: 118129584
Publisher: SPIE
Year: 2012
Weight: 478 KB
Volume: 8530
Category: Article
DOI: 10.1117/12.977553

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