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SPIE Proceedings [SPIE SPIE Laser Damage - Boulder, Colorado, USA (Sunday 23 September 2012)] Laser-Induced Damage in Optical Materials: 2012 - Bayesian approach of laser-induced damage threshold analysis and determination of error bars

✍ Scribed by Batavičiutė, Gintarė; Grigas, Povilas; Smalakys, Linas; Melninkaitis, Andrius; Exarhos, Gregory J.; Gruzdev, Vitaly E.; Menapace, Joseph A.; Ristau, Detlev; Soileau, M J

Book ID: 118129582
Publisher: SPIE
Year: 2012
Weight: 731 KB
Volume: 8530
Category: Article
DOI: 10.1117/12.976315

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