SPIE Proceedings [SPIE SPIE Laser Damage - Boulder, Colorado, USA (Sunday 22 September 2013)] Laser-Induced Damage in Optical Materials: 2013 - Confocal photothermal microscopy of thin films based on etalon and thermal lensing effects

✍ Scribed by Exarhos, Gregory J.; Gruzdev, Vitaly E.; Menapace, Joseph A.; Ristau, Detlev; Soileau, MJ; Sun, Z.; Mansoori, A.; Zhang, X.; Emmert, L. A.; Patel, D.; Menoni, C. S.; Rudolph, W.

• Book ID: 121373076
• Publisher: SPIE
• Year: 2013
• Weight: 868 KB
• Volume: 8885
• Category: Article
• DOI: 10.1117/12.2029955