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SPIE Proceedings [SPIE SPIE LASE: Lasers and Applications in Science and Engineering - San Jose, CA (Saturday 24 January 2009)] High-Power Diode Laser Technology and Applications VII - A comprehensive model of catastrophic optical-damage in broad-area laser diodes

✍ Scribed by Chin, A. K.; Bertaska, R. K.; Jaspan, M. A.; Flusberg, A. M.; Swartz, S. D.; Knapczyk, M. T.; Petr, R.; Smilanski, I.; Jacob, J. H.; Zediker, Mark S.

Book ID: 121372391
Publisher: SPIE
Year: 2009
Weight: 995 KB
Volume: 7198
Category: Article
DOI: 10.1117/12.804834

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