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SPIE Proceedings [SPIE SPIE Europe Security + Defence - Berlin, Germany (Monday 31 August 2009)] Electro-Optical and Infrared Systems: Technology and Applications VI - MTF measurement of infrared optical systems

✍ Scribed by Lengwenus, Andre; Huckridge, David A.; Ebert, Reinhard R.; Erichsen, Patrik

No coin nor oath required. For personal study only.

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