SPIE Proceedings [SPIE SPIE Europe Microtechnologies for the New Millennium - Dresden, Germany (Monday 4 May 2009)] VLSI Circuits and Systems IV - A new approach to accelerate SEU sensitivity evaluation in circuits with embedded memories

✍ Scribed by Portela-García, M.; Garcia Valderas, M.; Lopez-Ongil, C.; Entrena, L.; Riesgo, Teresa; de la Torre, Eduardo; Soares Indrusiak, Leandro

• Book ID: 120200241
• Publisher: SPIE
• Year: 2009
• Weight: 377 KB
• Volume: 7363
• Category: Article
• DOI: 10.1117/12.822057