SPIE Proceedings [SPIE SPIE Defense, Security, and Sensing - Orlando, Florida (Monday 5 April 2010)] Technologies for Synthetic Environments: Hardware-in-the-Loop Testing XV - Ground-based IRCM testing

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✍ Carter, Delano R.; Duffey, Patrick; Bachorski, Steve; Kägi, Martin; Havlicsek, H 📂 Article 📅 2010 🏛 SPIE ⚖ 972 KB

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