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SPIE Proceedings [SPIE SPIE Defense, Security, and Sensing - Orlando, Florida (Monday 5 April 2010)] Infrared Technology and Applications XXXVI - Carrier lifetime measurements in InAs/GaSb strained layer superlattice structures

✍ Scribed by Svensson, Stefan P.; Donetsky, Dmitry; Wang, Ding; Maloney, Patrick; Belenky, Gregory; Andresen, Bjørn F.; Fulop, Gabor F.; Norton, Paul R.

Book ID: 115532924
Publisher: SPIE
Year: 2010
Weight: 273 KB
Volume: 7660
Category: Article
DOI: 10.1117/12.849514

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