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SPIE Proceedings [SPIE SPIE Defense, Security, and Sensing - Orlando, FL (Monday 13 April 2009)] Non-Intrusive Inspection Technologies II - Lu3Al5O12-based materials for high 2D-resolution scintillation detectors

✍ Scribed by Nikl, M.; Tous, J.; Mares, J. A.; Prusa, P.; Mihokova, E.; Blazek, K.; Vedda, A.; Zorenko, Yu.; Gorbenko, V.; Babin, V.; Blackburn, Brandon W.

Book ID: 120158813
Publisher: SPIE
Year: 2009
Weight: 542 KB
Volume: 7310
Category: Article
DOI: 10.1117/12.818358

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