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SPIE Proceedings [SPIE SPIE Defense, Security, and Sensing - Baltimore, Maryland, USA (Monday 29 April 2013)] Next-Generation Spectroscopic Technologies VI - A microfabricated, low dark current a-Se detector for measurement of microplasma optical emission in the UV for possible use on-site

✍ Scribed by Abbaszadeh, Shiva; Karim, Karim S.; Karanassios, Vassili; Druy, Mark A.; Crocombe, Richard A.

No coin nor oath required. For personal study only.

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