SPIE Proceedings [SPIE SPIE Defense, Security, and Sensing - Baltimore, Maryland, USA (Monday 29 April 2013)] Terahertz Physics, Devices, and Systems VII: Advanced Applications in Industry and Defense - Micromachined probes for characterization of submillimeter-wave on-wafer components

✍ Scribed by Weikle, R. M.; Anwar, Mehdi F.; Crowe, Thomas W.; Barker, N. S.; Lichtenberger, A. W.; Manzur, Tariq; Bauwens, M. F.

• Book ID: 121402807
• Publisher: SPIE
• Year: 2013
• Weight: 356 KB
• Volume: 8716
• Category: Article
• DOI: 10.1117/12.2019784