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SPIE Proceedings [SPIE SPIE Defense, Security, and Sensing - Baltimore, Maryland, USA (Monday 29 April 2013)] Optical Pattern Recognition XXIV - Optical image processing and pattern recognition algorithms for optimal optical data retrieval

✍ Scribed by Walker, Brian; Lu, Thomas; Stuart, Sean; Reyes, George; Chao, Tien-Hsin; Casasent, David; Chao, Tien-Hsin

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