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SPIE Proceedings [SPIE SPIE Defense, Security, and Sensing - Baltimore, Maryland, USA (Monday 29 April 2013)] Micro- and Nanotechnology Sensors, Systems, and Applications V - Diffraction limit investigation with sub-wavelength pixels

✍ Scribed by Bergeron, A.; George, Thomas; Islam, M. Saif; Terroux, M.; Marchese, L.; Dutta, Achyut K.; Dufour, D.; Le Noc, L.; Chevalier, C.

Book ID: 121006841
Publisher: SPIE
Year: 2013
Weight: 951 KB
Volume: 8725
Category: Article
DOI: 10.1117/12.2015627

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