SPIE Proceedings [SPIE SPIE Defense, Security, and Sensing - Baltimore, Maryland, USA (Monday 29 April 2013)] Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XXIV - Compensation for instrument anomalies in imaging infrared measurements

✍ Scribed by Dobbins, Christopher L.; Holst, Gerald C.; Krapels, Keith A.; Dawson, James A.; Lightfoot, Jay A.; Edwards, William D.; Cobb, Ryan S.; Heckwolf, Amanda R.

• Book ID: 121002735
• Publisher: SPIE
• Year: 2013
• Weight: 770 KB
• Volume: 8706
• Category: Article
• DOI: 10.1117/12.2015473