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SPIE Proceedings [SPIE SPIE Defense, Security, and Sensing - Baltimore, Maryland, USA (Monday 29 April 2013)] Infrared Technology and Applications XXXIX - Thin film coating analysis using a novel IR camera and a broadband Echelle spectrograph

✍ Scribed by Pappas, Seth; Beardsley, Burt; Ritchie, George; Andresen, Bjørn F.; Fulop, Gabor F.; Hanson, Charles M.; Norton, Paul R.; Robert, Patrick

Book ID: 120998553
Publisher: SPIE
Year: 2013
Weight: 698 KB
Volume: 8704
Category: Article
DOI: 10.1117/12.2016683

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