SPIE Proceedings [SPIE SPIE Defense, Security, and Sensing - Baltimore, Maryland, USA (Monday 23 April 2012)] Next-Generation Spectroscopic Technologies V - Simple XRD algorithm for direct determination of cotton crystallinity

✍ Scribed by Liu, Yongliang; Druy, Mark A.; Crocombe, Richard A.; Thibodeaux, Devron; Gamble, Gary; Bauer, Philip; VanDerveer, Don

• Book ID: 120402776
• Publisher: SPIE
• Year: 2012
• Weight: 231 KB
• Volume: 8374
• Category: Article
• DOI: 10.1117/12.918628