SPIE Proceedings [SPIE SPIE Defense, Security, and Sensing - Baltimore, Maryland (Monday 23 April 2012)] Infrared Technology and Applications XXXVIII - IR CMOS: ultrafast laser-enhanced silicon imaging

✍ Scribed by Pralle, M. U.; Carey, J. E.; Homayoon, H.; Sickler, J.; Li, X.; Jiang, J.; Hong, C.; Sahebi, F.; Palsule, C.; McKee, J.; Andresen, Bjørn F.; Fulop, Gabor F.; Norton, Paul R.

• Book ID: 118271273
• Publisher: SPIE
• Year: 2012
• Weight: 354 KB
• Volume: 8353
• Category: Article
• DOI: 10.1117/12.919530