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SPIE Proceedings [SPIE SPIE Defense and Security Symposium - Orlando, FL (Sunday 16 March 2008)] Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XIX - What causes sampling artifacts?

✍ Scribed by Holst, Gerald C.; Holst, Gerald C.


Book ID
120449237
Publisher
SPIE
Year
2008
Weight
623 KB
Volume
6941
Category
Article

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