SPIE Proceedings [SPIE SPIE BiOS - San Francisco, California, USA (Saturday 22 January 2011)] Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing XVIII - 3D optical trapping calibration and optical micromanipulation using 808-nm diode-laser bar

✍ Scribed by Potcoava, Mariana; Conchello, Jose-Angel; Cogswell, Carol J.; Krzewina, Leo; Hoover, Erich; Wilson, Tony; Brown, Thomas G.; Kim, Myung K.; Squier, Jeff; Marr, David W. M.; Jimenez, Ralph

• Book ID: 118265364
• Publisher: SPIE
• Year: 2011
• Weight: 956 KB
• Volume: 7904
• Category: Article
• DOI: 10.1117/12.876010