SPIE Proceedings [SPIE SPIE Astronomical Telescopes + Instrumentation - Amsterdam, Netherlands (Sunday 1 July 2012)] Modeling, Systems Engineering, and Project Management for Astronomy V - WaFER: a tool to derive the focal surface of millimeter wave telescopes and characterize their optical response

✍ Scribed by Angeli, George Z.; Sandri, M.; Villa, F.; Dierickx, Philippe; Valenziano, L.

• Book ID: 120090471
• Publisher: SPIE
• Year: 2012
• Weight: 796 KB
• Volume: 8449
• Category: Article
• DOI: 10.1117/12.926078