SPIE Proceedings [SPIE Smart Structures and Materials - San Diego, CA (Sunday 26 February 2006)] Smart Structures and Materials 2006: Smart Sensor Monitoring Systems and Applications - Analysis of accuracy error and distortion in an operationally passive interferometric demodulation technique

✍ Scribed by Todd, M. D.; Seaver, M.; Nichols, J. M.; Trickey, S. T.; Inaudi, Daniele; Ecke, Wolfgang; Culshaw, Brian; Peters, Kara J.; Udd, Eric

• Book ID: 120086142
• Publisher: SPIE
• Year: 2006
• Weight: 820 KB
• Volume: 6167
• Category: Article
• DOI: 10.1117/12.657146