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SPIE Proceedings [SPIE Sixth International Symposium on Precision Engineering Measurements and Instrumentation - Hangzhou, China (Sunday 8 August 2010)] Sixth International Symposium on Precision Engineering Measurements and Instrumentation - Pulsed time-of-flight laser scanning techniques for industrial safety monitoring applications

✍ Scribed by Sun, Zhihui; Deng, Jiahao; Wang, Chang; Liu, Changjie; Tan, Jiubin; Wen, Xianfang

Book ID: 120524700
Publisher: SPIE
Year: 2010
Weight: 441 KB
Volume: 7544
Category: Article
DOI: 10.1117/12.885351

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