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SPIE Proceedings [SPIE Sixth International Symposium on Instrumentation and Control Technology: Sensors, Automatic Measurement, Control, and Computer Simulation - Beijing, China (Friday 13 October 2006)] Sixth International Symposium on Instrumentation and Control Technology: Sensors, Automatic Measurement, Control, and Computer Simulation - A new fast edge-matching algorithm based on corner constraint and edge constraint

✍ Scribed by Li, Haichao; Zhang, Guangjun; Fang, Jiancheng; Wang, Zhongyu

Book ID: 118005404
Publisher: SPIE
Year: 2006
Weight: 714 KB
Volume: 6358
Category: Article
DOI: 10.1117/12.717813

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