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SPIE Proceedings [SPIE San Diego '92 - San Diego, CA (Sunday 19 July 1992)] Polarization Analysis and Measurement - Birefringence characterization using transmission ellipsometry

✍ Scribed by Nee, Soe-Mie F.; Goldstein, Dennis H.; Chipman, Russell A.

No coin nor oath required. For personal study only.

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