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SPIE Proceedings [SPIE Rome and Frascati, Italy - Rome and Frascati (Friday 10 September 2004)] Advanced Laser Technologies 2004 - Femtosecond time-resolved reflectometry for studying micro and nanostructured strongly scattering material

✍ Scribed by Gordienko, V. M.; Bestemyanov, K. P.; Khomenko, A. S.; Konovalov, A. N.; Podshivalov, A. A.; Shcherbakov, Ivan A.; Giardini, Anna; Konov, Vitali I.; Pustovoy, Vladimir I.

Book ID: 120880943
Publisher: SPIE
Year: 2005
Weight: 347 KB
Volume: 5850
Category: Article
DOI: 10.1117/12.633701

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