SPIE Proceedings [SPIE Photonics West '97 - San Jose, CA (Saturday 8 February 1997)] Physics and Simulation of Optoelectronic Devices V - Polarization characterization of self-imaging GaAs/AlGaAs waveguide beamsplitters using Mueller matrix imaging polarimetry

✍ Scribed by Smith, Matthew H.; Sornsin, Elizabeth A.; Tayag, Tristan J.; Chipman, Russell A.; Osinski, Marek; Chow, Weng W.

• Book ID: 121257884
• Publisher: SPIE
• Year: 1997
• Weight: 826 KB
• Volume: 2994
• Category: Article
• DOI: 10.1117/12.275579