SPIE Proceedings [SPIE Photonics West '97 - San Jose, CA (Saturday 8 February 1997)] Micromachining and Imaging - Bent-fiber near-field scanning optical microscopy probes for use with commercial atomic force microscopes

✍ Scribed by Taylor, Roderick S.; Leopold, Kurt E.; Wendman, Mark A.; Gurley, Gus; Elings, Virgil B.; Michalske, Terry A.; Wendman, Mark A.

• Book ID: 121390958
• Publisher: SPIE
• Year: 1997
• Weight: 969 KB
• Volume: 3009
• Category: Article
• DOI: 10.1117/12.271220