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SPIE Proceedings [SPIE Photonics West 2001 - Electronic Imaging - San Jose, CA (Saturday 20 January 2001)] Human Vision and Electronic Imaging VI - Metric to evaluate the texture visibility of halftone patterns

✍ Scribed by Wang, Muge; Parker, Kevin J.; Rogowitz, Bernice E.; Pappas, Thrasyvoulos N.

No coin nor oath required. For personal study only.

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