SPIE Proceedings [SPIE Photonics Europe - Strasbourg, France (Monday 7 April 2008)] Optical and Digital Image Processing - Fringe pattern analysis using a one-dimensional modified Morlet continuous wavelet transform

✍ Scribed by Abid, Abdulbasit Z.; Schelkens, Peter; Ebrahimi, Touradj; Gdeisat, Munther A.; Burton, David R.; Cristóbal, Gabriel; Truchetet, Frédéric; Lalor, Michael J.; Abdul-Rahman, Hussein S.; Lilley, Francis

• Book ID: 120979086
• Publisher: SPIE
• Year: 2008
• Weight: 438 KB
• Volume: 7000
• Category: Article
• DOI: 10.1117/12.781677