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SPIE Proceedings [SPIE Photonics Europe - Strasbourg, France (Monday 3 April 2006)] Reliability of Optical Fiber Components, Devices, Systems, and Networks III - Passive component reliability analysis of issues relating to stoichiometric defects in glass

✍ Scribed by Kannan, SriRaman; Limberger, Hans G.; Matthewson, M. John

No coin nor oath required. For personal study only.

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