SPIE Proceedings [SPIE Photonics East '95 - Philadelphia, PA (Sunday 22 October 1995)] Three-Dimensional and Unconventional Imaging for Industrial Inspection and Metrology - Sensor and control electronics for an industrial 3D laser scanner

✍ Scribed by Asjes, Ronald J.; Kooijman, Kees S.; Vermeulen, Olaf T.; Duijve, Rene; Descour, Michael R.; Harding, Kevin G.; Svetkoff, Donald J.

• Book ID: 120383127
• Publisher: SPIE
• Year: 1996
• Weight: 266 KB
• Volume: 2599
• Category: Article
• DOI: 10.1117/12.230376