SPIE Proceedings [SPIE Photonics Asia - Beijing, China (Monday 5 November 2012)] Optical Design and Testing V - Analysis of thermal shock strength and quality factor with infrared optical domes

✍ Scribed by Gao, Youtang; Liu, Shuo; Xu, Yuan; Chang, Benkang; Wang, Yongtian; Du, Chunlei; Hua, Hong; Tatsuno, Kimio; Urbach, H. Paul

• Book ID: 118736141
• Publisher: SPIE
• Year: 2012
• Weight: 428 KB
• Volume: 8557
• Category: Article
• DOI: 10.1117/12.999389