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SPIE Proceedings [SPIE Photonics Asia - Beijing, China (Monday 5 November 2012)] Infrared, Millimeter-Wave, and Terahertz Technologies II - Infrared image quality assessment based on fractal dimension method

✍ Scribed by Zhang, Zhijie; Zhang, Jufeng; Yue, Song; Wang, Chensheng; Zhang, Cunlin; Zhang, Xi-Cheng; Li, He; Shi, Sheng-Cai

Book ID: 121471451
Publisher: SPIE
Year: 2012
Weight: 657 KB
Volume: 8562
Category: Article
DOI: 10.1117/12.999437

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