SPIE Proceedings [SPIE Photonics Asia 2010 - Beijing, China (Monday 18 October 2010)] Optical Design and Testing IV - In the era of global optimization, the understanding of aberrations remains the key to designing superior optical systems

✍ Scribed by Bentley, Julie L.; Olson, Craig; Youngworth, Richard N.; Wang, Yongtian; Bentley, Julie; Du, Chunlei; Tatsuno, Kimio; Urbach, Hendrik P.

• Book ID: 115484287
• Publisher: SPIE
• Year: 2010
• Weight: 1006 KB
• Volume: 7849
• Category: Article
• DOI: 10.1117/12.871720